42947659
9780780339866
1997 6th International Symposium on the Physical and Failure Analysis of Integrated Circuits
by IEEE, Reliability/Components, Packaging and Manufacturing, Institute of Electrical and Electronics Engineers, Inc. Staff
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Product details
- ISBN-13: 9780780339866
- ISBN: 078033986X
- Publication Date: 1997
- Publisher: IEEE
AUTHOR
SUMMARY
IEEE, Reliability/Components, Packaging and Manufacturing is the author of '1997 6th International Symposium on the Physical and Failure Analysis of Integrated Circuits', published 1997 under ISBN 9780780339866 and ISBN 078033986X.
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