4015976
9780521017954
Reflection Electron Microscopy and Spectroscopy for Surface Analysis
by Wang, Zhong Lin
31245
List Price
Discount
30% Off
You Save
$25.93
About this item
- Condition: New
- Provider: LightningBooks Contact
- Provider Rating: 85%
- Ships From: Multiple Locations
- Shipping: Standard, Expedited (tracking available)
- Comments: Fast shipping! All orders include delivery confirmation.
Product details
- ISBN-13: 9780521017954
- ISBN: 0521017955
- Publisher: Cambridge University Press
AUTHOR
SUMMARY
Entirely self-contained, this book serves as a comprehensive source for graduate students and working scientists using electron microscopy and spectrometry techniques for surface studies. The text is written to combine basic techniques with special applications, theories with experiments giving a complete coverage of RHEED and REM.Wang, Zhong Lin is the author of 'Reflection Electron Microscopy and Spectroscopy for Surface Analysis' with ISBN 9780521017954 and ISBN 0521017955.
[read more]
The ValoreBooks Guarantee
With our dedicated customer support team, you can rest easy knowing that we're doing everything we can to save you time, money, and stress.
