4791098
9780123705976
VLSI Test Principles And Architectures Design for Testability
by Wang, Laung-Terng, Wu, Cheng-Wen, Wen, Xiaoqing
72212
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- Condition: Acceptable
- Provider: Read A Book Contact
- Provider Rating: 82%
- Ships From: Multiple Locations
- Shipping: Standard
- Comments: IMP: Acceptable- Do not include ACCESS CODE, CD-ROM or companion materials even if stated in item title. It may contain highlighting/markings throughout, and the covers and corners may show shelf wear. Corners, pages may be dent. All text is legible. 27
Product details
- ISBN-13: 9780123705976
- ISBN: 0123705975
- Publication Date: 2006
- Publisher: Morgan Kaufmann Pub
AUTHOR
SUMMARY
Covering VLSI testing from digital, analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits, this edited work discusses future test technology trends and challenges facing the nanometer design era, including how to deal with physical failures and soft errors.Wang, Laung-Terng is the author of 'VLSI Test Principles And Architectures Design for Testability', published 2006 under ISBN 9780123705976 and ISBN 0123705975.
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